Analytik Jena B-100YP 晶圓表麵檢查燈

Analytik Jena  B-100YP 95-0127-04表麵檢查燈

Analytik Jena B-100YP表麵檢查燈可快速檢查加工表麵的瑕疵
，灰塵
，異物等小至10微米的瑕疵、小顆粒，高強度抗衝擊外殼由有Cool-Touch阻熱材料製造，可長時間工作不產生高溫。黃色濾光片能濾掉波長小於500nm的光線，產生543nm、574和576nm的光線。高對比度的光線可檢測表麵小於10微米的顆粒。b-100Y鋁合金外殼
，B-100YP帶塑料外殼。表麵晶粒檢查燈主要用於LCD濾光片、偏光板、晶圓、半導體、玻璃或金屬表麵刮痕及灰塵檢查。

B-100YP 95-0127-04表麵檢查燈主要特點

• 檢查精密加工表麵的瑕疵


、汙點、異物等

• 快速無損檢測小至10微米的瑕疵、小顆粒

• 有效地探測出生產過程是早期的汙物，節省生產時間及不必要的成本

• 100瓦高強度汞燈發出543,574及576nm波長光譜

• 黃色濾色片濾掉波長小於500nm的光線
，防止產生熒光幹擾

• 高對比度的光線能清晰檢測到精細的表麵粒子

• B-100Y是鋁合金外殼; B-100YP帶塑料外殼

• 燈頭人體工學設計，易於操作

Analytik Jena B-100Y和B-100YP

These models feature a yellow filter which blocks wavelengths shorter than 500 nm and produces three strong mercury lines at 543, 574 and 576 nm. The high contrast light is produced for fine surface particle detection. Particles down to 10 microns are routinely visible with this lamp. The B-100Y is built with aluminum housing and the B-100YP with a plastic housing. These lamps are excellent for semiconductor wafer inspection as most photoresist absorption occurs below 450 nm.

Applications include:

Fluorescence Inspections

Non Destructive Testing

Leak Detection

Readmission

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